Measuring probe device for a probe microscope, measuring cell and scanning probe microscope
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United States of America Patent
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Aug 6, 2013
Grant Date -
Oct 14, 2010
app pub date -
Jul 24, 2008
filing date -
Jul 24, 2007
priority date (Note) -
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Abstract
The invention relates to a measuring probe device for a probe microscope, in particular a scanning probe microscope, with a measuring probe holder and a measuring probe arranged on the measuring probe holder, which is set up for a probe microscopic investigation of a sample, wherein on the measuring probe holder, a measuring probe chamber is formed, which receives the measuring probe at least partially and is open on a side away from the measuring probe holder, and is configured to receive a liquid surrounding the measuring probe. The invention also relates to a measuring cell for receiving a liquid sample for a probe microscope, a scanning probe microscope with a measuring probe device and a scanning probe microscope with a measuring cell.
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