Fast time-of-flight mass spectrometer with improved data acquisition system
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United States of America Patent
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Jul 23, 2013
Grant Date -
Mar 3, 2011
app pub date -
Sep 17, 2010
filing date -
Nov 27, 2002
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Abstract
Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
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