Particle beam irradiation apparatus and control method of the particle beam irradiation apparatus

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United States of America Patent

PATENT NO 8487282
SERIAL NO

13577509

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Abstract

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A particle beam irradiation apparatus that can measure and display a dose two-dimensional distribution during scan while reducing degradation of a particle beam shape, including a particle beam generation portion; a particle beam emission control portion; a two-dimensional beam scanning portion; a sensor portion including first linear electrodes arranged in parallel in a first direction and second linear electrodes arranged in parallel in a second direction orthogonal to the first direction; a beam shape calculation portion that calculates a center of gravity of the particle beam from outputs of each the first linear and second linear electrodes and that obtains a two-dimensional beam shape of the particle beam around the center of gravity; a storage portion that accumulates and stores the two-dimensional beam shapes; and a display portion that displays the two-dimensional beam shapes as a two-dimensional distribution of a dose.

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Patent Owner(s)

Patent OwnerAddress
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION72-34 HORIKAWA-CHO SAIWAI-KU KAWASAKI-SHI KANAGAWA 212-0013

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Furukawa, Takuji Chiba, JP 21 208
Hanawa, Katsushi Kita-Ku, JP 9 164
Inaniwa, Taku Chiba, JP 10 246
Iseki, Yasushi Yokohama, JP 17 264
Kakutani, Nobukazu Yokohama, JP 5 122
Maeda, Kazunao Suginami-Ku, JP 4 44
Noda, Kouji Chiba, JP 23 382
Sato, Shinji Chiba, JP 207 2571

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