Semiconductor device and method for manufacturing the same

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United States of America Patent

PATENT NO 8476680
APP PUB NO 20110284935A1
SERIAL NO

13029556

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Abstract

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A semiconductor device includes: a semiconductor substrate; a gate electrode formed on the semiconductor substrate with a gate insulating film interposed therebetween; a side wall spacer formed on a side wall of the gate electrode; source/drain regions formed in opposing portions of the semiconductor substrate with the gate electrode and the side wall spacer interposed therebetween; and a stress-applying insulating film covering the gate electrode, the side wall spacer, and an upper surface of the semiconductor substrate. A gate-length-direction thickness of an upper portion of the side wall spacer is at least larger than a gate-length-direction thickness of a middle portion thereof.

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Patent Owner(s)

  • PANNOVA SEMIC, LLC

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Yamada, Takayuki Toyama, JP 284 2581

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