Process for enhancing dye polymer recording yields by pre-scanning coated substrate for defects

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United States of America Patent

PATENT NO 8472020
APP PUB NO 20060181706A1
SERIAL NO

11057941

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Abstract

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A method for enhancing recording yields by monitoring dye polymer formation on a glass substrate is provided. After the glass substrate is coated with a dye polymer layer and before pits are formed on the dye-polymer coated glass, the dye polymer coated glass substrate is scanned to detect defects. The dye-polymer coated glass is discarded on the one hand if the defects detected through the scanning are at or above an unacceptable threshold level, and on the other hand data is written on the dye-polymer coated glass if the defects detected through the scanning are below the unacceptable threshold level.

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Patent Owner(s)

Patent OwnerAddress
CT ACQUISITION HOLDCO LLC2525 EAST CAMELBACK ROAD SUITE 850 PHOENIX AS 85016

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sweeney, Thomas I Jermyn, US 3 76

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