System and method for monitoring parameters in containers
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United States of America Patent
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Jun 25, 2013
Grant Date -
Jul 7, 2011
app pub date -
Jul 8, 2010
filing date -
May 26, 2006
priority date (Note) -
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Abstract
A system for measuring parameters in a container is disclosed. A system for measuring multiple parameters includes a container having a solution, at least one sensor in conjunction with a tag is in proximity to an impedance analyzer and a reader that constitute a measurement device. The at least one sensor is configured to determine at least one parameter of the solution. The tag is configured to provide a digital ID associated with the sensor, where the container is in proximity to the reader and an impedance analyzer. The impedance analyzer is configured to send and receive a given range of frequencies from the sensor, based on the parameter and calculate parameter changes based on the response.
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