Methods and systems for measurement and control of process parameters
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jun 11, 2013
Grant Date -
Dec 29, 2011
app pub date -
Jun 25, 2010
filing date -
Jun 25, 2010
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Systems and methods for monitoring various process parameters, primarily in connection with processes for the sterilization of particulate foods in a continuous thermal process, make use of application specific integrated circuits (ASIC) that provide process-related data for batch or continuous thermal treatment when the circuit is embedded in a particle subjected to such treatment. The preferred methods are described in connection with process design, and with at least near real-time process control using process data provided by such circuits.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully