Closure mechanism for pressure test chambers for testing electronic components, in particular ICs
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United States of America Patent
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May 28, 2013
Grant Date -
Aug 5, 2010
app pub date -
Jul 1, 2008
filing date -
Jul 12, 2007
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Abstract
A closure mechanism for pressure test chambers for testing electronic components, in particular ICs, has a plurality of pivoting jaws. At least some of the pivoting jaws have at least one lifting apparatus which can be advanced to two interacting cavity elements, which surround a cavity, by means of the pivoting jaws. Furthermore, at least some of the pivoting jaws have at least one locking device in order to move spacer elements into an intermediate space between the associated pivoting jaws and the compressed cavity element, as a result of which the tightness of the cavity is maintained even when the lifting apparatuses are retracted.
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