Film-thickness measuring device using PLL circuit
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Apr 30, 2013
Grant Date -
May 19, 2011
app pub date -
Sep 22, 2008
filing date -
Sep 22, 2008
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A phase comparator (4) for detecting a phase difference between a first signal and a second signal, a first oscillating circuit (1) for supplying the phase comparator with a reference signal as the first signal, and a DDS (8) as a second oscillating circuit for outputting a signal according to an output of the above-mentioned phase comparator are provided.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully