Inspecting device including detachable probe

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United States of America Patent

PATENT NO 8424385
APP PUB NO 20110030478A1
SERIAL NO

12575650

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Abstract

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An inspecting device including a detachable probe has a link structure, and thus a subject having various diameters is tested. In addition, since various probes are changeably used in a scanner housing, ultrasonic wave testing and eddy current testing are simultaneously performed.

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Patent Owner(s)

Patent OwnerAddress
KOREA PLANT SERVICE & ENGINEERING CO LTDNAJU-SI 58326

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Choi, Sanghoon Yongin-Si, KP 11 98
Kim, Gyungsub Suwon-Si, KR 2 71
Park, Minsu Yongin-Si, KR 16 99
Woo, Jangmyong Yongin-Si, KR 2 71

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