Projection exposure apparatus and projection exposure method

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United States of America Patent

PATENT NO 8421999
APP PUB NO 20100195078A1
SERIAL NO

12523917

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Exposure areas are wholly overlapped by moving a gradient refractive index lens array in a direction perpendicular to a scanning direction, or by providing a plurality of gradient refractive index lens arrays, an optical filter having a density distribution of lightness and darkness to compensate light transmission nonuniformity of the gradient refractive index lens array is arranged, or an opening control plate for limitedly using only of a uniform portion is provided. Two or more means may be simultaneously provided among the aforementioned mean. Moreover, any one of a microscopic transmission shutter array, a microscopic reflection shutter array, and a microscopic light emitter array is used instead of a mask, or an illuminating device and the mask.

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Patent Owner(s)

Patent OwnerAddress
TOKYO DENKI UNIVERSITY2 KANDA-NISHIKICHO 2-CHOME CHIYODA-KU TOKYO 101-8457

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Horiuchi, Toshiyuki Tokyo, JP 5 60
Kobayashi, Hiroshi Tokyo, JP 902 9719

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