Circuit test apparatus
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United States of America Patent
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Apr 16, 2013
Grant Date -
Dec 10, 2009
app pub date -
Oct 2, 2008
filing date -
Jun 10, 2008
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A circuit testing apparatus for testing a device under test is disclosed. The device under test includes a first terminal end and second terminal end for generating a first output signal and a second output signal, respectively. The circuit testing apparatus determines whether the device under test has passed the test according to the first and second output signals.
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