Temperature measuring device, thermal treatment device using the same, temperature measuring method

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United States of America Patent

PATENT NO 8419272
APP PUB NO 20100086006A1
SERIAL NO

11917969

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Abstract

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A temperature measuring apparatus and a temperature measuring method, comprising a light intensity measuring unit, a calculation unit, and a temperature output unit; wherein an object to be heated having a uniquely defined correlation between temperature and refractive index is irradiated with a probe laser beam in the light intensity measuring unit, and a light intensity property is determined which represents a relationship between time and light intensity of a reflected light or a transmitted light occurring as a result of interference of the multiply-reflected probe laser beam within the object to be heated. In the calculation unit, a virtual object to be heated having equivalent dimensional, thermal, and optical characteristics to those of the object to be heated is subjected to a thermal incidence equivalent to the heating conditions of the object to be heated. A light intensity property of the virtual object to be heated is irradiated with a probe laser beam having an equivalent property to said probe laser beam is acquired, and a virtual object to be heated having a light intensity property is obtained as a replicated object to be heated. The temperature output unit acquires temperature of the object to be heated at a predetermined position thereon at a predetermined time on the basis of the replicated object to be heated.

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Patent Owner(s)

Patent OwnerAddress
HIROSHIMA UNIVERSITYJAPAN'S HIROSHIMA COUNTY EAST HIROSHIMA CITY MIRROR MOUNTAIN ONE EYE 3 TIMES NO 2 HIGASHIHIROSHIMA-SHI HIROSHIMA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Higashi, Seiichiro Higashihiroshima, JP 20 317

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