Methods and apparatus for local outlier detection
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United States of America Patent
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Apr 9, 2013
Grant Date -
Apr 20, 2006
app pub date -
May 20, 2005
filing date -
May 24, 2001
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Abstract
A method and apparatus for data analysis according to various aspects of the present invention is configured to identify statistical outliers in test data for components, including local outliers representing outliers within subsets of larger data populations.
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