Interferometric measurement of non-homogeneous multi-material surfaces

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United States of America Patent

PATENT NO 8416425
APP PUB NO 20120257215A1
SERIAL NO

13528786

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Abstract

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Correction factors for the ALR and PTR parameters of magnetic-head sliders are determined by calculating an effective reflectivity and a corresponding PCOR at each pixel of the air-bearing surface. The absolute value of reflectivity at each pixel of the AlTiC air-bearing surface is obtained from an empirical equation relating it to modulation. The ratio of Al2O3 and TiC in the AlTiC surface is then calculated at every pixel assuming a linear relationship between the absolute value of AlTiC reflectivity and the theoretical reflectivity of each constituent. The linear relationship is then also used to calculate the effective (complex) reflectivity for the AlTiC material from the relative concentrations of Al2O3 and TiC at each pixel.

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Patent Owner(s)

Patent OwnerAddress
BRUKER NANO INC112 ROBIN HILL ROAD GOLETA CA 93117

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Best, G Lawrence Tucson, US 4 8
Chen, Dong Tucson, US 558 5317
Munteanu, Florin Tucson, US 9 24
Novak, Erik Tucson, US 13 24

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