Terahertz investigative system and method
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United States of America Patent
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Mar 19, 2013
Grant Date -
Dec 24, 2009
app pub date -
Jan 23, 2009
filing date -
Jan 24, 2008
priority date (Note) -
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Abstract
A system for investigating a plurality of samples having varying positions or orientations moving with respect to the system, the system including an emitter of terahertz radiation for irradiating a sample provided in a sample space; a detector of terahertz radiation configured to detect radiation reflected from said sample space; and determining means to determine if radiation reflected from said sample space is from a sample with a predetermined orientation in the sample space.
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