Surface tension measuring device and method

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 8390815
APP PUB NO 20100188662A1
SERIAL NO

12667184

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

Low-cost interface property measuring device and method enabling high-precision and simple measurement of an interface property. The interface property measuring device comprises an optical fiber probe (1) having a first end face (2) at least part of which is inclined with respect to a direction perpendicular to a fiber axis, a light supply (24) for supplying light from a second end face on the side opposite to the first end face of the optical fiber probe, a reflected light amount measuring device (24) for measuring the reflected light amount and a moving mechanism (18) for moving at least one of the optical fiber probe and an object (21) to be measured such that the first end face of the optical fiber probe passes through an interface (23) of the object (21) at a constant speed, and the interface property measuring device acquires the interface property of the object to be measured according to the result of measurement of the reflected light amount when the first end face of the optical fiber probe passes through the interface of the object to be measured.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
NATIONAL UNIVERSITY CORPORATION SHIZUOKA UNIVERSITY836 OHYA SURUGA-KU SHIZUOKA-SHI SHIZUOKA-KEN 422-8529

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ozawa, Yusuke Hamamatsu, JP 7 11
Saito, Takayuki Hamamatsu, JP 172 2014
Sanada, Toshiyuki Hamamatsu, JP 5 15

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation