Method for detecting low concentration gas

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United States of America Patent

PATENT NO 8365576
APP PUB NO 20100294020A1
SERIAL NO

12591599

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Abstract

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Disclosed is a method for detecting a low concentration gas. In the method, a measurand gas containing the target gas in a concentration of 50 ppm or less is supplied to an oscillation element which contains a quartz crystal resonator and a zeolite including a metal complex (such as a zeolite including a cobalt phthalocyanine complex) present on or above the quartz crystal resonator. The target gas is then detected through a change in resonance frequency of the quartz crystal resonator, the change being caused by the adsorption of the target gas by the metal-complex-including zeolite.

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Patent Owner(s)

Patent OwnerAddress
NATIONAL UNIVERSITY CORPORATION NAGOYA INSTITUTE OF TECHNOLOGYAICHI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Inomata, Tomohiko Nagoya, JP 1 2
Masuda, Hideki Okazaki, JP 78 1080
Sawaki, Taku Nagoya, JP 8 58

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