Spectrometer for identifying analyte materials

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United States of America Patent

PATENT NO 8358420
SERIAL NO

12660403

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A spectrometer for identifying an analyte material. One embodiment of the spectrometer includes a single ultrashort pulsed laser (USPL) source, a fiber interferometer, a frequency converter and a transceiver. The USPL source is configured to generate a laser beam. The interferometer is operatively coupled to the USPL source, and is configured to split the laser beam into a first laser beam and a second laser beam, providing a variable difference in lengths between the paths of the first laser beam and the second laser beam. The spectrometer then electronically scans the variable-path second laser beam over the first laser beam to generate interferogram patterns. The frequency converter is configured to receive the interferogram patterns from the interferometer, and perform a frequency conversion of the interferogram patterns to form an output beam. The transceiver is configured to transmit the output beam and to receive radiation from the analyte material. The radiation is thereafter used to identify the analyte material.

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Patent Owner(s)

Patent OwnerAddress
SYSTEM PLANNING CORPORATION3601 WILSON BOULEVARD ARLINGTON VA 22201

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
DeWitt, Kristin Marie Vienna, US 1 40
DeWitt, Merrick Joseph Vienna, US 1 40

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