Resonance compensation in scanning probe microscopy

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United States of America Patent

PATENT NO 8347409
APP PUB NO 20110289635A1
SERIAL NO

12785840

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Abstract

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A method includes generating, using a sensor, a data signal. The data signal includes a first component based on a motion in a first direction of an actuator configured to provide motion between a sample and a probe in the first direction, the first direction substantially in the plane of the sample; and a second component based on at least one of topographic variations of the sample in a second direction, and a materials property of the sample. The method further includes generating, using a processor, a compensatory signal based on the first component of the data signal generated by the sensor; and providing the compensatory signal to the actuator.

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Patent Owner(s)

Patent OwnerAddress
MASSACHUSETTS INSTITUTE OF TECHNOLOGY77 MASSACHUSETTS AVENUE CAMBRIDGE MA 02139

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Burns, Daniel James Cambridge, US 1 5
Fantner, Georg Ernest Chavannes-près-Renens, CH 3 6
Youcef-Toumi, Kamal Cambridge, US 43 508

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