Method of calibrating a test instrument
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United States of America Patent
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Dec 25, 2012
Grant Date -
Jun 23, 2011
app pub date -
Nov 16, 2010
filing date -
Aug 19, 2008
priority date (Note) -
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Abstract
A method for calibrating a test instrument and a set of leads having proximal ends coupled with the test instrument is described. The method includes shorting the distal ends of the set of leads during calibration and zeroing the test instrument during the shorting. The shorting includes coupling an electrical conductor with at least two of the distal ends.
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