Imaging patterns of features with skewed edges
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United States of America Patent
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Dec 11, 2012
Grant Date -
Dec 9, 2010
app pub date -
Jan 30, 2008
filing date -
Jan 30, 2008
priority date (Note) -
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Abstract
A method is provided for forming an image of a pattern of features on media which includes determining a pitch of the features along first and second directions and determining a first size of a first pixel based at least on the pitch of the features along the first direction. A second size of a second pixel is determined based at least on the pitch of the features along the second direction. An offset is determined along the scan direction between a first and second scan-line of pixels, based at least on the skew angle and the first size. The imaging head is controlled to form the first pixel comprising the determined first size and the second pixel comprising the determined second size. The imaging head is controlled to form the first scan-line and the second scan-line, offset from one another by the determined offset.
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