Method of evaluating evenness of suplatast tosilate crystal, even crystal, and process for producing the same

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Dec 11, 2012
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Sep 1, 2011
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Feb 24, 2011
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Jul 13, 2004

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Abstract

Provided are a method for evaluating evenness of suplatast tosilate crystals; stable suplatast tosilate crystals exhibiting evenness in optical purity; and a method for producing the suplatast tosilate crystals.

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TAIHO PHARMACEUTICAL CO LTD	CHIYODA-KU TOKYO 101-8444

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Inventor Name	Address	# of filed Patents	Total Citations
Nagai, Keiko	Saitama, JP	7	28
Ushio, Takanori	Tokushima, JP	3	2

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Method of evaluating evenness of suplatast tosilate crystal, even crystal, and process for producing the same

Number of patents in Portfolio can not be more than 2000

United States of America Patent

13034052

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PATENT NO	8329150
APP PUB NO	20110213179A1
SERIAL NO	13034052
DOCKET NO

US Family Size	Non-US Coverage
Patent Longevity Expired	Forward Citations

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
December 11, 2012	US,8329150,B2 US8329150B2	GRANTED PATENT AS SECOND PUBLICATION
September 01, 2011	US,20110213179,A1 US20110213179A1	FIRST PUBLISHED PATENT APPLICATION

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13034052

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