Method of producing a semiconductor device with an aluminum or aluminum alloy electrode

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United States of America Patent

PATENT NO 8324044
APP PUB NO 20110086471A1
SERIAL NO

12971173

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Abstract

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A method of producing a semiconductor device that has a silicon substrate including a first major surface and a second major surface thereof, a front surface device structure being formed in a region of the first major surface, the method has a step of forming a rear electrode in a region of the second major surface, which includes evaporating or sputtering aluminum-silicon onto the second major surface to form an aluminum silicon film as a first layer of the rear electrode, the aluminum silicon film having a silicon concentration of at least 2 percent by weight when the thickness thereof is less than 0.3 μm.

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Patent Owner(s)

Patent OwnerAddress
FUJI ELECTRIC CO LTDKAWASAKI TANABE XINTIAN KAWASAKI JAPAN 1 NO 1 KAWASAKI-SHI KANAGAWA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hayashi, Takashi Nagano, JP 273 2675
Kazama, Kenichi Nagano, JP 22 239
Nakajima, Tsunehiro Nagano, JP 27 108
Sasaki, Koji Nagano, JP 229 1819
Shimizu, Akio Nagano, JP 41 571
Wakimoto, Hiroki Nagano, JP 26 245

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