Manufacturing method for probe contact

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United States of America Patent

PATENT NO 8312626
APP PUB NO 20100050431A1
SERIAL NO

12516155

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Abstract

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To make the fracturing position controlled conveniently with high precision when the substrate end of the probe contact is fractured and cut off.

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Patent Owner(s)

Patent OwnerAddress
YAMAICHI ELECTRONICS CO LTD2-16-2 MINAMIKAMATA OTA-KU TOKYO 144-8581

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Suzuki, Takeyuki Kanagawa, JP 91 503
Ujike, Ryo Kanagawa, JP 10 84
Wakabayashi, Yoshinori Chiba, JP 7 53

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