Probe for testing electrical properties of a test sample
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United States of America Patent
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Nov 13, 2012
Grant Date -
Sep 3, 2009
app pub date -
Oct 31, 2006
filing date -
Oct 31, 2005
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Abstract
A probe for testing electrical properties of test samples includes a body having a probe arm defining proximal and distal ends, the probe arm extending from the body at the proximal end of the probe arm, whereby a first axis is defined by the proximal and the distal ends. The probe arm defines a geometry allowing flexible movement of the probe arm along the first axis and along a second axis perpendicular to the first axis, and along a third axis orthogonal to a plane defined by the first axis and the second axis.
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