Simulated mounting structure for testing electrical devices
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United States of America Patent
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Nov 6, 2012
Grant Date -
May 13, 2010
app pub date -
Nov 12, 2008
filing date -
Nov 12, 2008
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A testing apparatus or test jig is configured to accept a electrical device for testing prior to final assembly. In one example, a pair of conductive conveying belts compliantly engage a partially assembled photovoltaic (PV) module by its sides, and electrodes engage orthogonal sides of the module. The test apparatus or jig can be use for a variety of electrical tests, and may, for example be connected to a high potential (HiPot) tester.
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