Systems and methods for performing measurements of one or more materials
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United States of America Patent
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Oct 23, 2012
Grant Date -
Sep 9, 2010
app pub date -
May 17, 2010
filing date -
Jun 2, 2006
priority date (Note) -
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Abstract
Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof.
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