Methods for characterization of electronic circuits under process variability effects
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United States of America Patent
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Oct 9, 2012
Grant Date -
Jan 29, 2009
app pub date -
Jun 23, 2008
filing date -
Jun 22, 2007
priority date (Note) -
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Abstract
A method for determining an estimate of statistical properties of an electronic system comprising individual components subject to manufacturing process variability is disclosed. In one aspect, the method comprises obtaining statistical properties of the performance of individual components of the electronic system, obtaining information about execution of an application on the system, simulating execution of the application based on the obtained information about execution of the application on the system for a simulated electronic system realization constructed by selecting individual components with the obtained statistical properties determining the delay and energy of the electronic system, and determining the statistical properties of the delay and energy of the electronic system.
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