Electrooptic probe for vector measurement of an electromagnetic field
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United States of America Patent
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Sep 11, 2012
Grant Date -
Oct 22, 2009
app pub date -
Jun 15, 2007
filing date -
Jun 16, 2006
priority date (Note) -
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Abstract
A device for measuring two components of an electromagnetic field in an analysis zone includes a light source for sending a polarized light beam into a polarization-maintaining optical fiber. The beam is directed along one axis of the fiber. An isotropic electrooptic material is placed in the zone for receiving the beam from the optical fiber via a substantially quarter-wave plate, which has its axes oriented at an angle of substantially 45° to the axes of the optical fiber and for sending a beam into the fiber. The plate is slightly detuned in regard to its characteristics or its orientation. The device further includes a phase-shifter for phase-shifting the beam sent into the fiber, wherein the phase-shifter is set so as to impose a phase shift equal and opposite to that imposed by the fiber and mechanism for analyzing the orientation and ellipticity of the wave exiting the phase-shifter.
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