Iterative feedback tuning in a scanning probe microscope

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Aug 21, 2012
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Jan 20, 2011
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Dec 1, 2008
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Nov 30, 2007

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Abstract

A method, system, device, and software for automatically determining PI feedback parameters in a scanning probe microscopy application setup using an iterative feedback tuning process.

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G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....

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Inventor Name	Address	# of filed Patents	Total Citations
Altenburg, Simon J	Kiel, DE	1	4
Bengtsson, Paul	Floda, SE	3	6
Svensson, Krister	Gothenburg, SE	7	24

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Iterative feedback tuning in a scanning probe microscope

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United States of America Patent

12744587

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PATENT NO	8250667
APP PUB NO	20110016592A1
SERIAL NO	12744587
DOCKET NO

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DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
August 21, 2012	US,8250667,B2 US8250667B2	GRANTED PATENT AS SECOND PUBLICATION
January 20, 2011	US,20110016592,A1 US20110016592A1	FIRST PUBLISHED PATENT APPLICATION

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12744587

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