Testing method of semiconductor laser and laser testing device
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United States of America Patent
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Aug 21, 2012
Grant Date -
Sep 23, 2010
app pub date -
Mar 17, 2010
filing date -
Mar 17, 2009
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Abstract
A testing method of a semiconductor laser emitting a wavelength under a test different from a reference wavelength in a given wavelength range includes: a first step of obtaining a length of an optical fiber under the test satisfying a reference dispersion condition at the wavelength under the test, based on the reference dispersion condition for the test and a unit dispersion amount of the optical fiber; and a second step of inputting a modulation signal that is a modulated laser light of the semiconductor laser having a wavelength as the wavelength under the test into an optical fiber having substantially the same length as the length obtained in the first step and evaluating an output of the optical fiber.
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