Method and device for detecting structural abnormalities in a spherical particle
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United States of America Patent
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Aug 21, 2012
Grant Date -
Feb 4, 2010
app pub date -
Oct 11, 2007
filing date -
Oct 13, 2006
priority date (Note) -
Expired
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Abstract
The method for detecting at least one structural defect in a spherical particle (33) comprises at least the following steps of passing the particle (33) into at least one induction coil (15); exciting the induction coil (15) in order to induce Foucault currents in the particle (33); acquiring an output signal at the terminals of the induction coil (15); and analyzing the signal in order to establish whether or not the particle (33) comprises a structural defect. A plurality of output signals are acquired by passing the particle (33) successively into one or more induction coils (15) with different positions of the particle (33), the or each induction coil (15) being excited at least each time the particle (33) passes in order to induce Foucault currents in the particle (33).
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