Feature pattern recognition system, method, and program
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United States of America Patent
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Aug 14, 2012
Grant Date -
Dec 27, 2007
app pub date -
Aug 2, 2005
filing date -
Aug 10, 2004
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A feature pattern recognition system, method, and program capable of recognizing feature pattern with a high accuracy are provided. Discrete symbols (nucleotide symbols or the like) constituting a to-be-recognized sequence (a DNA sequence or the like) are converted to numerals by using symbol frequencies that are obtained according to sequence positions or types of the discrete symbols to generates test data or a test data matrix Xtest, a matrix calculation (Ytest=WpromXtest or the like) of multiplying a separation matrix (Wprom or the like) obtained by an independent component analysis or a principal component analysis with the test data or the test data matrix Xtest is performed, separation data or a separation data matrix Ytest is obtained, and it is decided in which side of a threshold exists a feature decision element (elements of first row or the like) of the Ytest, so that it is decided whether or not the feature pattern (a promoter or the like) exists in the sequence by using a feature decision element (multiple rows of elements may be used).
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