Measuring apparatus

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 8243264
APP PUB NO 20110043825A1
SERIAL NO

12857874

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Abstract

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A measuring apparatus measuring a surface shape of a target includes a projection optical system to radiate a line beam on the target, an imaging device to acquire a reflected line beam reflected from the target, an optical imaging system to cause the reflected line beam to form an image on a receiving surface of the imaging device to acquire a shape of the line beam on the target, and a splitting mechanism to split the reflected line beam so as to acquire the shape of the line beam on the target at different positions in an extending direction of the line beam and guide the split reflected line beams to the imaging device. A plurality of segments are set on the receiving surface while each segment in which at least one region is set as a reception region is partitioned into a plurality of regions, and the optical imaging system causes the split reflected line beams to form images on the reception regions in the different segments, respectively.

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Patent Owner(s)

Patent OwnerAddress
NIDEC-READ CORPORATIONKYOTO-SHI KYOTO 615-0854

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Enomoto, Yoshiyuki Itabashi-ku, JP 23 309
Isozaki, Hisashi Itabashi-ku, JP 31 261

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