Positive resist composition and a pattern forming method using the same

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United States of America Patent

PATENT NO 8241830
APP PUB NO 20070042291A1
SERIAL NO

11504040

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A positive resist composition comprises (A) a compound capable of generating sulfonic acid, bis(alkylsulfonyl)amide, or tris(alkylsulfonyl)methine upon irradiation with actinic ray or radiation, and (B) a resin capable of increasing the solubility in an alkali developer by action of an acid having specific repeating units, and a pattern forming method using the same.

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Patent Owner(s)

Patent OwnerAddress
FUJIFILM CORPORATION26-30 NISHIAZABU 2-CHOME MINATO-KU TOKYO 106-8620

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sato, Kenichiro Shizuoka, JP 122 1201

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