Higher harmonics atomic force microscope
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United States of America Patent
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Aug 7, 2012
Grant Date -
Sep 18, 2008
app pub date -
Jun 21, 2006
filing date -
Jun 23, 2005
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The invention concerns a microscopic system with atomic force, comprising a probe tip placed on one end of a lever arm (2), oscillating means (1) adapted to oscillate said probe tip substantially based on the fundamental frequency of said lever arm, said system including control means (7) for controlling said oscillating means to vary the oscillation frequency of said tip based on a plurality of harmonics of said lever arm. The invention is characterized in that said control means comprise an input receiving a parameter representing an operating threshold of said system, to vary the oscillation frequency of said tip based on at least one harmonic of said lever arm when said signal corresponds to a state of said system higher than said operating threshold.
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