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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
LAYTEC AKTIENGESELLSCHAFT	SEESENER STR 10-13 BERLIN 10709

International Classification(s)

• G01B:MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIME....

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Zettler, Joerg-Thomas	Berlin, DE	7	25
Zettler, Johannes K	Berlin, DE	1	1

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
July 31, 2012	US,8233158,B2   US8233158B2	GRANTED PATENT AS SECOND PUBLICATION
November 18, 2010	US,20100290046,A1   US20100290046A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 8233158

Method and apparatus for determining the layer thickness and the refractive index of a sample

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