Enhanced imaging of features
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United States of America Patent
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Jul 31, 2012
Grant Date -
Feb 25, 2010
app pub date -
Jul 11, 2007
filing date -
Jul 28, 2006
priority date (Note) -
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Abstract
Methods for imaging patterns of features by thermal transfer involve controlling intensities of a plurality of beams. The intensities of beams that image edge portions of a feature may be set to be different from the intensities of beams that image interior portions of the feature. Beams that image home and away edges of a feature may be controlled to have different intensities. Apparatus for imaging patterns of features may comprise a controller configured to maintain intensity information for channels of a multi-channel imaging head. The controller uses the intensity information to set intensities of those channels that correspond to edge portions of features being imaged in a current swath of the imaging head.
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