Family

Loading Family data...

• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
VARCO I/P	10 000 RICHMOND HOUSTON TX 77042

International Classification(s)

• B07B:SEPARATING SOLIDS FROM SOLIDS BY SIEVING, SCREENIN....

• 2006 Application Filing Year
• B07B Class
• 72 Applications Filed
• 35 Patents Issued To-Date
• 48.62 % Issued To-Date

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Scott, Eric L	Conroe, US	3	52
# of filed Patents : 3 Total Citations : 52
Strong, Gary S	Huntsville, US	2	82
# of filed Patents : 2 Total Citations : 82

Cited Art Landscape

Load Citation

• No Cited Art to Display

Loading Cited Art Landscape...

Patent Citation Ranking

• 5 Citation Count
• B07B Class

• 12.77 % this patent is cited more than
• 13 Age

Forward Cite Landscape

Load Citation

• No Forward Cites to Display

Loading Forward Cite Landscape...

Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
July 31, 2012	US,8231010,B2   US8231010B2	GRANTED PATENT AS SECOND PUBLICATION
June 12, 2008	US,20080135463,A1   US20080135463A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 9640364

Charged particle beam system and method of operating a charged particle beam system

---

Abstract

---

The present disclosure relates to a gas field ion source comprising a housing, an electrically conductive tip arranged within the housing, a gas supply for supplying one or more gases to the housing, wherein the one or more gases comprise neon or a noble gas with atoms having a mass larger than neon, and an extractor electrode having a hole to permit ions generated in the neighborhood of the tip to pass through the hole. A surface of the extractor electrode facing the tip can be made of a material having a negative secondary ion sputter rate of less than 10⁻⁵ per incident neon ion.

---

 

---

Description

---

Claims

---

Claims data not available

---

Legal Events

 

• FEPP2024
• MAFP2020
• CC2018
• CC2017
• I2017
• STCF2017
• AS2017
• FEPP2016
• P2016
• F2015

Date	Code	Event	Description
Dec 23, 2024	FEPP	FEE PAYMENT PROCEDURE	free format text: MAINTENANCE FEE REMINDER MAILED (ORIGINAL EVENT CODE: REM.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY
Sep 20, 2020	MAFP	MAINTENANCE FEE PAYMENT	free format text: PAYMENT OF MAINTENANCE FEE, 4TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1551); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY year of fee payment: 4
Jul 10, 2018	CC	CERTIFICATE OF CORRECTION
Dec 19, 2017	CC	CERTIFICATE OF CORRECTION
May 02, 2017	I	Issuance
Apr 12, 2017	STCF	INFORMATION ON STATUS: PATENT GRANT	free format text: PATENTED CASE
Jan 26, 2017	AS	ASSIGNMENT	free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:NOTTE, JOHN A., IV;RAHMAN, FHM-FARIDUR;HUANG, WEIJIE;AND OTHERS;SIGNING DATES FROM 20140723 TO 20140728;REEL/FRAME:041093/0209 Owner name: CARL ZEISS MICROSCOPY, LLC, NEW YORK
Dec 05, 2016	FEPP	FEE PAYMENT PROCEDURE	free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY
Apr 14, 2016	P	Published
Dec 15, 2015	F	Filing