Apparatus for measuring IQ imbalance

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United States of America Patent

PATENT NO 8229028
APP PUB NO 20090028231A1
SERIAL NO

12034627

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Abstract

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The present invention relates to an apparatus and a method for measuring an in phase and quadrature (IQ) imbalance. One embodiment according to the present general inventive concept can provide a method for measuring a Tx IQ imbalance generated in an IQ up-conversion mixer and an Rx IQ imbalance generated in an IQ down-conversion mixer, that includes measuring a first IQ imbalance corresponding to a first combination of the Rx IQ imbalance with the Tx IQ imbalance, measuring a second IQ imbalance corresponding to a second combination of the Rx IQ imbalance with the Tx IQ imbalance and obtaining the Tx IQ imbalance and the Rx IQ imbalance from the first IQ imbalance and the second IQ imbalance.

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Patent Owner(s)

Patent OwnerAddress
GCT SEMICONDUCTOR INCSAN JOSE CA 95131

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lee, Eal Wan Seoul, KR 6 59
Lee, Jeong Woo Seoul, KR 93 789
Lee, Kyeongho Seoul, KR 73 1275
Lee, Seung-Wook Seoul, KR 41 455
Park, Joonbae Seoul, KR 39 691

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