Device for measuring superfine particle masses

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United States of America Patent

PATENT NO 8225681
APP PUB NO 20100083737A1
SERIAL NO

12532474

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A device for measuring superfine particle masses including a quartz oscillator and an exposure system having at least two measuring chambers. Each of the at least two measuring chambers has a same geometry, a deposition surface for particles, and an aerosol feed directed at the respective disposition surface configured to feed an aerosol onto the respective deposition surface. At least one of the respective deposition surfaces is disposed on the quartz oscillator.

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Patent Owner(s)

Patent OwnerAddress
FORSCHUNGSZENTRUM KARLSRUHE GMBH76133 KARLSRUHE

International Classification(s)

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  • 2008 Application Filing Year
  • G01G Class
  • 142 Applications Filed
  • 89 Patents Issued To-Date
  • 62.68 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances2008200920102011201220132014201520162017201820190255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Muelhopt, Sonja Karlsruhe, DE 2 12
Paur, Hanns-Rudolf Karlsruhe, DE 10 60
Waescher, Thomas Rauenberg, DE 2 12

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Patent Citation Ranking

  • 4 Citation Count
  • G01G Class
  • 1.80 % this patent is cited more than
  • 13 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges277242112201 - 1011 - 2021 - 3031 - 4041 - 5051 - 60100 +0510152025303540455055606570758085

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