Electrical testing apparatus with a tilt adjusting arrangement for testing an electrical test sample and electrical testing method
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United States of America Patent
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Jul 10, 2012
Grant Date -
Jan 28, 2010
app pub date -
Jul 21, 2009
filing date -
Jul 26, 2008
priority date (Note) -
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Abstract
An electrical testing apparatus for testing an electrical test sample. The apparatus includes a conductor substrate (12) which is electrically connected via a contact spacing converter (7) to a test head (2). The conductor substrate is mechanically connected to a first stiffening device (26) and is thereby stiffened. At least one spacer (30) which penetrates the conductor substrate (12) is mechanically connected to the contact spacing converter (7) and is held on the first stiffening device (26) via at least one tilt adjusting arrangement (34).
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