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Country	kind	publication No.	Filing Date	Type	Sub-Type
TW	B	TWI347670	Feb 01, 2007	Patent	Grant
Type : Patent Sub-Type : Grant
GRANTED PATENT OR PATENT OF ADDITION		Phase-change memory and fabrication method thereof		Aug 21, 2011
US	A1	US20080203374	Jan 30, 2008	Patent	Application
Type : Patent Sub-Type : Application
FIRST PUBLISHED PATENT APPLICATION		Phase-change memory and fabrication method thereof		Aug 28, 2008

• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
PROMOS TECHNOLOGIES INC	3F NO 19 LI-HSIN ROAD SCIENCE-BASED INDUSTRIAL PARK HSIN CHU CITY

International Classification(s)

• H01L:SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICE....

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Chuo, Yen	Taipei, TW	18	141
# of filed Patents : 18 Total Citations : 141
Hsu, Hong-Hui	Changhua County, TW	22	204
# of filed Patents : 22 Total Citations : 204

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• 0 Citation Count
• H01L Class

• 0 % this patent is cited more than
• 13 Age

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
July 10, 2012	US,8216877,B2   US8216877B2	GRANTED PATENT AS SECOND PUBLICATION
July 21, 2011	US,20110177667,A1   US20110177667A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 9606212

Systems and methods for time/frequency indexed pulse calibrations for vector network analyzers

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Abstract

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A method for measuring scattering parameters in a device under test (DUT) using a vector network analyzer (VNA), includes calibrating the VNA to generate corrections for deterministic setup defects and mapping a plurality of error terms based on a plurality of time indices, wherein each time indicia is associated with an error term. A test signal is transmitted to the DUT to obtain a measurement signal from the DUT in response to the test signal. The generated corrections to obtained measurements are time aligned based on the mapped error terms.

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Description

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Claims

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• STCF2017
• AS2014
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Mar 28, 2017	I	Issuance
Mar 08, 2017	STCF	INFORMATION ON STATUS: PATENT GRANT	free format text: PATENTED CASE
Dec 22, 2014	AS	ASSIGNMENT	free format text: CORRECTIVE ASSIGNMENT TO CORRECT THE RECEIVING PARTY NAME PREVIOUSLY RECORDED ON REEL 034571 FRAME 0523. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT;ASSIGNOR:MARTENS, JON S.;REEL/FRAME:042386/0766 Owner name: ANRITSU COMPANY, CALIFORNIA Effective Date: Dec 22, 2014
Dec 22, 2014	AS	ASSIGNMENT	free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:MARTENS, JON S.;REEL/FRAME:034571/0523 Owner name: ANRITSU CORPORATION, CALIFORNIA Effective Date: Dec 22, 2014
Mar 14, 2014	F	Filing