Imprint lithography system and method

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United States of America Patent

PATENT NO 8215946
APP PUB NO 20100072652A1
SERIAL NO

12582091

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Abstract

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System, method and process for imprinting a substrate using controlled deformation of a substrate and/or a template. The substrate and/or template may be positioned in single wave formation or double wave formation during an imprint lithography process.

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Patent Owner(s)

Patent OwnerAddress
CITIBANK N A388 GREENWICH STREET NEW YORK NY 10013

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Choi, Byung-Jin Austin, US 194 2163
GanapathiSubramanian, Mahadevan Austin, US 18 268
Meissl, Mario Johannes Austin, US 38 151

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