Method and device for temperature prediction

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United States of America Patent

PATENT NO 8197128
APP PUB NO 20090129433A1
SERIAL NO

12269321

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Abstract

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A method and a device for temperature prediction or measurement are disclosed. The method comprises: acquiring temperature data outputted from a thermometer probe; selecting some temperature data within a valid time period from the acquired data; determining a first specific time point according to the slope change rate of the temperature curve within the valid time period and an initial temperature within the valid time period; determining a second specific time point according to the slope at or before the first specific time point; calculating a value of temperature y according to an hyperbolic formula; determining a final temperature of the object according to the maximum slope of the temperature curve in the valid time period, the initial temperature of the temperature curve in the valid time period, and the value of temperature y.

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Patent Owner(s)

Patent OwnerAddress
SHENZHEN MINDRAY BIO-MEDICAL ELETRONICS CO LTDMINDRAY BUILDING KEJI 12TH ROAD SOUTH HI-TECH INDUSTRIAL PARK NANSHAN SHENZHEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
He, Xianliang Shenzhen, CN 19 20
Liu, Zhonghua Shenzhen, CN 34 75
Zhang, Bo Shenzhen, CN 1006 7322
Zuo, Pengfei Shenzhen, CN 10 17

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