Methods for determining enantiomeric purity with varying chiral analyte concentration

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United States of America Patent

PATENT NO 8189188
APP PUB NO 20100045969A1
SERIAL NO

12083163

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Abstract

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A new strategy for the quantitative determination of enantiomeric purity that combines guest-host complexation, spectroscopy, and chemometric modeling. Spectral data for samples of known enantiomeric composition is subjected to a type of multivariate regression modeling known as partial least squares (“PLS-1”) regression. The PLS-1 regression produces a mathematical model that can be used to predict the enantiomeric composition of a set of samples of unknown enantiomeric purity. In this strategy, the concentration of the chiral compound does not have to be fixed or known.

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Patent Owner(s)

Patent OwnerAddress
BAYLOR UNIVERSITY213 PAT NEFF HALL ONE BEAR PLACE BOX 97034 WACO TX 76798-7034

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Busch, Kenneth W Waco, US 15 272
Busch, Marianna Waco, US 5 29
Ingle, Jemina Rose Lawrence, US 1 12

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