Transition temperature microscopy
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United States of America Patent
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May 15, 2012
Grant Date -
Feb 18, 2010
app pub date -
Aug 15, 2008
filing date -
Aug 15, 2008
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Abstract
A system and method for automatic analysis of temperature transition data over an area of a sample surface. The system relies on the use of a microfabricated probe, which can be rapidly heated and cooled and has a sharp tip to provide high spatial resolution. The system also has fast x-y-z positioners, data collection, and algorithms that allow automatic analysis of and visualization of temperature transition data.
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