Method for determining the quality of a quantity of properties, to be employed for verifying and specifying circuits
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United States of America Patent
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Apr 24, 2012
Grant Date -
Dec 31, 2009
app pub date -
Jun 22, 2009
filing date -
Sep 15, 2005
priority date (Note) -
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Abstract
A method is specified for determining the quality of a quantity of properties describing a machine, including a step for determining the existence of at least one sub-quantity of interrelated properties (P0, P1, . . . Pn) of the form Pi=(forall t. Ai(t)=>Zi(t)), wherein Ai(t) present an initial state and Zi(t) a target state for a corresponding property and at least one initial state Ai is dependant on internal signals and including a step for checking whether at least one aspect of the input/output behavior of the machine described by the properties, which cannot be derived from an individual property Pi, is described to such an accurate extent that one property Q exists, which represents this aspect without being dependant on the internal signals. The procedure is capable of providing a measurement and can particularly be used in the verification and specification of circuits.
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