Integrated circuit testing module configured for set-up and hold time testing
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United States of America Patent
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Apr 24, 2012
Grant Date -
Mar 22, 2007
app pub date -
Oct 25, 2006
filing date -
Sep 28, 2001
priority date (Note) -
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Abstract
Systems and methods of testing integrated circuits are disclosed. The systems include a test module configured to operate between automated testing equipment and an integrated circuit to be tested. The testing interface is configured to test time sensitive parameters of the integrated circuit. The testing interface includes components for generating addresses, commands, and test data to be conveyed to the integrated circuit as well as a clock adjustment component. By adjusting the clock synchronization controlling the test signals to be conveyed to the integrated circuit, set-up time and hold time can be tested. The systems are configured to test set-up time and hold time of individual data channels, for example, an individual address line of the integrated circuit.
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